Non-ohmic properties of CaCu3Ti4O12 thin films deposited By RF-sputtering
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a Laboratory for Development and Methods, Paul Scherrer Institut, 5232 Villigen-PSI, Switzerland b General Energy Research Department, Paul Scherrer Institut, 5232 Villigen-PSI, Switzerland c Massachusetts Institute of Technology (MIT), Department of Materials Science and Engineering and Department of Nuclear Science and Engineering, 77 Massachusetts Ave, Cambridge, MA 02139, USA d Electron Mic...
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ژورنال
عنوان ژورنال: Journal of Materials Science: Materials in Electronics
سال: 2017
ISSN: 0957-4522,1573-482X
DOI: 10.1007/s10854-017-7458-5